Atomic Force Microscope ( SPM complete system) Brisk-AFM UK
Brisk UK Atomic Force Microscopy ( AFM) also known as Scanning Force Microscopy (SFM) is very high resolution type of Scanning Probe Microscopy (SPM) with a benefit of 1000 times better than Optical Diffraction limit. Resolution in the order of a nanometer
Scanning Probe Microscope, (AFM-SFM)
Optical Microscope’s inability to image sizes smaller than a wavelength of visible light resulted in the invention of nano-scopes in the last decade.