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Atomic Force Microscope ( SPM complete system)

Atomic Force Microscopy ( AFM) also known as Scanning Force Microscopy (SFM) is very high resolution type of Scanning Probe Microscopy (SPM) with a benefit of 1000 times better than Optical Diffraction limit. Resolution in the order of a nanometer

Scanning Probe Microscope, (AFM-SFM)

Optical Microscope’s inability to image sizes smaller than a wavelength of visible light resulted in the invention of nano-scopes in the last decade.

AFM is at the top of the list, due to its low price and multi-applications.